Copyright © 2006 The Institute of Electronics, Information and Communication Engineers
Special Section on Machine Vision Applications -- Papers -- Photometric Analysis |
Photometric Linearization under Near Point Light Sources
The authors are with Matsushita Electric Industrial Co., Ltd., Kyoto-fu, 6190237 Japan. E-mail: sato.satoshi{at}jp.panasonic.com
We present a method for classifying image pixels of real images into multiple photometric factors: specular reflection, diffuse reflection, attached shadows and cast shadows. Conventional photometric linearization methods cannot correctly classify pixels under near point light sources, since they assume parallel light. To satisfy this assumption, our method utilizes a photometric linearization method that divides images into small regions. It also propagates linearization coefficients from neighboring regions. Our experimental results show that the proposed method can correctly classify image pixels into photometric factors, even if images are obtained under near point light sources.
Key Words: photometric linearization, near point light sources, photometric factors, image segmentation
Manuscript received November 1, 2005. Manuscript revised January 24, 2006.