IEICE Transactions on Information and Systems

IEICE Transactions on Information and Systems 2006 E89-D(7):2004-2011; doi:10.1093/ietisy/e89-d.7.2004

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Copyright © 2006 The Institute of Electronics, Information and Communication Engineers

Special Section on Machine Vision Applications -- Papers -- Photometric Analysis

Photometric Linearization under Near Point Light Sources

Satoshi SATO, Kazutoyo TAKATA and Kunio NOBORI

The authors are with Matsushita Electric Industrial Co., Ltd., Kyoto-fu, 619–0237 Japan. E-mail: sato.satoshi{at}jp.panasonic.com

We present a method for classifying image pixels of real images into multiple photometric factors: specular reflection, diffuse reflection, attached shadows and cast shadows. Conventional photometric linearization methods cannot correctly classify pixels under near point light sources, since they assume parallel light. To satisfy this assumption, our method utilizes a photometric linearization method that divides images into small regions. It also propagates linearization coefficients from neighboring regions. Our experimental results show that the proposed method can correctly classify image pixels into photometric factors, even if images are obtained under near point light sources.

Key Words: photometric linearization, near point light sources, photometric factors, image segmentation

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Manuscript received November 1, 2005. Manuscript revised January 24, 2006.

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This Article Abstract Full Text (PDF) Alert me when this article is cited Alert me if a correction is posted Services Email this article to a friend Similar articles in this journal Alert me to new issues of the journal Add to My Personal Archive Download to citation manager Request Permissions Google Scholar Articles by SATO, S. Articles by NOBORI, K. Search for Related Content Social Bookmarking          What's this?