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IEICE Transactions on Information and Systems 2006 E89-D(11):2811-2813; doi:10.1093/ietisy/e89-d.11.2811
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Copyright © 2006 The Institute of Electronics, Information and Communication Engineers

Regular Section -- Letters -- Software Engineering

Pairwise Test Case Generation Based on Module Dependency

Jangbok KIM1, Kyunghee CHOI1 and Gihyun JUNG2

1 The authors are with the Graduate School of I.C., Ajou Univ., Suwon, 443–749, Korea. E-mail: bbok{at}ajou.ac.kr, 2 The author is with the School of E.E., Ajou Univ., Suwon, 443–749, Korea.

This letter proposes a modified Pairwise test case generation algorithm. The proposed algorithm produces additional test cases that may not be covered by Pairwise algorithm due to the dependency between internal modules of software systems. The algorithm produces additional cases utilizing internal module dependencies. The algorithm effectively increases the coverage of testing without significantly increasing the number of test cases.

Key Words: Pairwise, module dependency, software test

Manuscript received March 15, 2006. Manuscript revised June 28, 2006.


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